Direct measurement of two-photon absorption and refraction properties of SZ2080 TM -based resists at 515 nm: insights into 3D printing / Stavrou, Michalis (CC BY)

Access restriction

There is no access restriction for this record.

Copyright

CC BY: Attribution 4.0 International. You can find more information here.

Bibliographic data

fullscreen: Direct measurement of two-photon absorption and refraction properties of SZ2080 TM -based resists at 515 nm: insights into 3D printing / Stavrou, Michalis (CC BY)

Access restriction

There is no access restriction for this record.

Copyright

CC BY: Attribution 4.0 International. You can find more information here.

Files

External resources

Periodical

Title:: Nanophotonics

Publication:: Berlin: de Gruyter

Note:: Gesehen am 07.07.20; Open Access; Namensnennung - Nicht kommerziell - Keine Bearbeitungen 4.0 International

Scope:: Online-Ressource

ISSN:: 2192-8614

ZDB-ID:: 2674162-3

VÖBB-Katalog:: 35304435

Previous Title:: Nanophotonics

Keywords:: Zeitschrift

Classification:: Naturwissenschaften

Collection:: Naturwissenschaften

Copyright:: Rights reserved

Accessibility:: Free Access

Article

Author:: Stavrou, Michalis; Ladika, Dimitra; Skliutas, Edvinas; Jukna, Vytautas; Gray, David; Farsari, Maria; Juodkazis, Saulius; Malinauskas, Mangirdas

Title:: Direct measurement of two-photon absorption and refraction properties of SZ2080 TM -based resists at 515 nm: insights into 3D printing

Publication:: Berlin: de Gruyter, 2025

Language:: English

Scope:: Online-Ressource

Note:: Open Access; Archivierung/Langzeitarchivierung gewährleistet

Keywords:: optical characterization ; non-linear optics ; laser-matter interaction ; 3D printing ; additive manufacturing ; microstructures

Classification:: Naturwissenschaften

URN:: urn:nbn:de:101:1-2509100346104.965355718928

Collection:: Naturwissenschaften

Copyright:: CC BY

Accessibility:: Free Access

Formats and links

Cite